Advanced Spectral Technology, Inc # 606; Advanced Spectral Technology AST provides manual to fully automated precision motion controlled systems, utilizing application specific optical designs and sensors in any of the Infrared, Visible and UV spectrums. AST employs the latest cutting edge technologies and expertise to solve the industry's most challenging defect detection, inspection, infrared imaging, Semiconductor Industry ...

Packaging and Assembly Equipment; Backgrind, Slicing, Lapping, Polishing Equipment; Cleaning, Washing Equipment for Assembly & Packaging; Dicing, Sawing, Scribing, Separation Equipment; Die Bonding, Attach Equipment; Die Removal Equipment; Die Sorter, Pick & Place; Flip Chip Placement Systems; Wafer Level Bonders; Wafer Mount, Taping Equipment; Repair, Rework Equipment; Inspection & Measurement Products; Defect, Particle, Contam. Detection, Review, Inspect; MEMS Equipment; Wafer Level Bonders; Process, Assembly Equipment ...

Thermal Processing; Packaging & Assembly Equipment; Process Equipment; Lithography & Exposure; Inspection & Measurement Products; Spin On Glass & Sog, On Dielectric & Sod Track Systems; Bumping Systems; Cleaning, Washing Equipment for Assembly & Packaging; Litho for Wlp; Bumping, 3D Interconnect Aligners; Defect, Particle, Contam. Detection & Review & Inspect, Semiconductor Components, Assembly Equipment ...

Packaging and Assembly Equipment; Litho for WLP: Bumping, D Interconnect Aligners; Inspection & Measurement Products; Defect, Particle, Contam. Detection, Review, Inspect; Die Inspection, Die Shear; Film Thickness, Uniformity Measurement, Ellipsometer; Line Width, Critical Dimension (CD) Measurement; Microscopes: Confocal Scanning, D Video; Microscopes: Optical Microscopes; Overlay Measurement; Metrology, Topology, Nanotopography, Flatness, Cryst.Orient; Test Equipment; Probe Card Maintenance, Semiconductor Components, Assembly Equipment ...

Automation Systems, Automation Systems; Inspection Equipment; Measuring Equipment; Platforms; Sensors, Detectors, Transducers; Software; Our laser based nondestructive testing and measurement solutions are engineered for defect detection, testing pipe ovality, bore straightness, laser measurement, underwater mapping; quality control ...

Inspection & Measurement; Probe Card Maintenance & Analysis Systems; Materials, Test; Equipment, Test; Probe Cards, Dut Boards, Probing Accessories & Incl Ceramic & Special Purpose Probe Cards; Materials, Substrate; Test, Monitor Wafers, Reclaim or Virgin; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Logic Test Systems; Test Sockets, Contactors & Contact Accessories, Electronic Plugs ...

Inspection & Measurement; Defect, Particle, Bump, Contamination Detection, Review or Inspection ...

Inspection & Measurement Products; Defect, Particle, Contam. Detection, Review, Inspect; Die Inspection, Die Shear; Test Equipment; Memory Test Systems; Optical Test Systems; Package Test Systems, Semiconductor Industry ...

Equipment, Assembly; Equipment, Inspection & Measurement; Deposition, Physical Vapor & Pvd, Sputtering, Evaporation Equipment; Dispensing Systems; hing, Stripping, Ashing Dry & Wet Equipment; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Equipment, Mems; Cleaning, Washing Equipment for Assembly & Packaging; Tape Automated Bonding & Tab, Bumped Tape Automated Bonding & Btab Equipment; Thermal, Assembly Equipment ...

Inspection & Measurement; Wafers; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr; Inspection & Metrology; Led; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Plate Inspection Equipment; Fpd Inspection Equipment, Materials & Parts, Semiconductor Industry ...

Plate Inspection Equipment; Inspection & Measurement; XRay, Xrf, 3D XRay, Lexes Systems; Instruments, Bench Top Test; Defect, Particle, Bump, Contamination Detection, Review or Inspection, Semiconductor Industry ...

Slitting Machine Drive System, Laser Diameter Gauge, DC Spark Tester, Pipe Inspection System, Cap Inspection System, Print Defect Detection System, Rotogravure Machine, Auto Registration Control System, Ceramic Anilox Roll, Rotogravure Machine Auto Registration Control System, Offset Printing Machine Control Panel, Product Testing, Printing Machines ...

Microscopes; Optical Microscopes; Die Inspection, Die Shear; Thermal Sensing, Measurement, Analysis; Wafer, Substrate Metrology, Topology, Nanotopography, Flatness Measurement, Crystalline Orientation; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Line Width, Critical Dimension & Cd Measurement; Inspection & Measurement ...

Equipment, Assembly; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Probe Cards, Dut Boards, Probing Accessories & Incl Ceramic & Special Purpose Probe Cards; Dispensing Systems; HVAC, Temperature, Humidity, Contamination Control; Equipment, Test; Failure Analysis Systems; Die Bonding, Attach Equipment; Printing Equipment, Screen Printing, Alignment, Film Printing; HVAC, Temperature, Humidity, Semiconductor Industry, Process Control, Printing Equipment ...

Defect Detection; Accessories, General; Process Control, Test & Measurement; Print Inspection; Process Control, Test & Measurement ...

Market leader in surface inspection systems and automatic defect detection for over 20 years. Winner of CTC Technology Product of the Year award ...