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Microscopes; Confocal Scanning Microscope, 3D Video Microscopes; Plate Inspection Equipment; Inspection & Measurement; Wire Bonding Inspection, Test; Microscopes; Optical Microscopes ...

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Scanning Electron Microscopes, Jeol, Sem, Transmission Electron Microscopes, Tem, Nmr, Nuclear Magnetic Resonance, Ms, Mass Spectrometry, Mass Spectrometors, Defect Review, Esr; Jeol-A World Leader In Electron Microscopes (Sems and Tems), Electron Beam Lithography, Defect Review and Inspection Tools) and Analytical Instruments Including Mass Spectrometers, Nmrs and Esrs; Jeol ...

202 Equipment, General Use; Microscopes; Optical Microscopes; Components, Parts; Equipment, Inspection & Measurement; Heating Elements, Coils, Insulation, Vestibule Blocks, Furnace Components; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr; XRay, Xrf, 3D XRay, Lexes Systems; Vibration Isolation Systems; Film Thickness, Thickness, Uniformity Measurement, Semiconductor Industry, Heating Components, Heating Elements ...

Inspection & Measurement; XRay, Xrf, 3D XRay, Lexes Systems; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr, Semiconductor Industry ...

Equipment, Test; Wafer, Substrate Metrology, Topology, Nanotopography, Flatness Measurement, Crystalline Orientation; Probing Equipment Incl. Analytical, Circuit, Manual, E Beam, Optical, Wafer Probers; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr; Equipment, Nanotechnology; Inspection & Measurement, Semiconductor Industry ...

Equipment, Inspection & Measurement; CV (capacitance-to-voltage) Probe systems; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Die Inspection, Die Shear; Film Thickness, Thickness, Uniformity Measurement, Ellipsometer; Microscopes: Optical Microscopes; Plate Inspection Equipment; Resistivity Measurement, 4 point probe, Sheet resistance; Stress, Refractive Index, Reflectivity & Conductivity Measurement; Wafer, Substrate Metrology, Topology, Nanotopography, Flatness Measurement ...

Testing Labs; Products; Microanalysis & Digital Imaging Systems for Materials Analysis; Failure Analysis Test Sockets; Surface Analysis Systems; Microscopes & Scanning Electron, Acoustic, Confocal, Upright, Inverted & Stereo; Specialized Objectives; Failure Analysis Laser Cutter; Micro Electronics Laser; Ftir Equipment, Electronic Plugs ...

Gifts, Premiums & Hobbies, Binoculars, Telescope, Telescope Accessories, Spotter Scopes, Tripods, Night Vision Equipment, Riflescopes, Rangefinders, Microscopes, Magnifiers, Hunting Gear, Telescopes and Binoculars ...

Measuring, Inspection & Quality Control Laser Measuring Equipment; Measuring, Inspection & Quality Control Layer Thickness Measurement; Measuring, Inspection & Quality Control Measuring Microscopes with Digital Image Processing; Measuring, Inspection & Quality Control Profile Projector, Machine Tool ...

Cables, ieee 1394 connectors, memory card, cards connectors, memory card, cards readers, microscopes, mobile phone, phones PC data cables, modular jacks, multipole connectors, networking, Cable Assembly, Connector, Mobile Charger, Electronic Connectors, Electronic Plugs ...

xRay, Xrf, 3D XRay, Lexes Systems; Inspection & Measurement; Wafer, Substrate Metrology, Topology, Nanotopography, Flatness Measurement, Crystalline Orientation; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr, Semiconductor Industry ...

Equipment, Inspection & Measurement; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Die Inspection, Die Shear; Line Width, Critical Dimension (CD) Measurement; Microscopes: Confocal Scanning Microscope, 3-D Video Microscopes ...