The Laboratory Offers Nist Traceable Magnification Calibration Standards for Optical and Electron Microscopes, Analytical Services Include Metallography, Electron Probe and Scanning Electron Microscopy, Surface Roughness Measurement, and Failure Analysis, Topsfield Massachusetts ...

Imina Technologies high precision robots helps scientists to easily interact with and characterize samples under light and electron microscopes and speed up the production of results from their research experiments ...

Products; Microscopes & Scanning Electron, Acoustic, Confocal, Upright, Inverted & Stereo ...

Inspection & Measurement Products; Chromatograph; Film Thickness, Uniformity Measurement, Ellipsometer; Flat, Notch Finding System; Instruments, Bench Top Test; Leak Detection Systems Vacuum or Gas; Microscopes: Atomic Force Microscopes (AFM); Particle Monitors, Analyzers Airborne or Liquid; Plate Inspection Equipment; Spectrometers, FTIR, ATR FTIR, Auger Electron (AES), SIMS; Stress, Refractive Index, Reflectivity, Conductivity Meas; Metrology, Topology, Nanotopography, Flatness, Cryst.Orient, Semiconductor Industry ...

Inspection & Measurement; Wafers; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr; Inspection & Metrology; Led; Defect, Particle, Bump, Contamination Detection, Review or Inspection; Plate Inspection Equipment; Fpd Inspection Equipment, Materials & Parts, Semiconductor Industry ...

Scanning Electron Microscopes, Jeol, Sem, Transmission Electron Microscopes, Tem, Nmr, Nuclear Magnetic Resonance, Ms, Mass Spectrometry, Mass Spectrometors, Defect Review, Esr; Jeol-A World Leader In Electron Microscopes (Sems and Tems), Electron Beam Lithography, Defect Review and Inspection Tools) and Analytical Instruments Including Mass Spectrometers, Nmrs and Esrs; Jeol ...

Products; Microanalysis & Digital Imaging Systems for Materials Analysis; Specimen Preparation Equipment; Failure Analysis Laser Cutter; Micro Electronics Laser; Surface Analysis Systems; Microscopes & Scanning Electron, Acoustic, Confocal, Upright, Inverted & Stereo; Specialized Objectives; Analytical Probe Stations & Instruments, Equipment, Accessories; Image Analysis Systems & Software; Testing Labs ...

Equipment, Test; Wafer, Substrate Metrology, Topology, Nanotopography, Flatness Measurement, Crystalline Orientation; Probing Equipment Incl. Analytical, Circuit, Manual, E Beam, Optical, Wafer Probers; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr; Equipment, Nanotechnology; Inspection & Measurement, Semiconductor Industry ...

Sem, Focused Ion Beam & Fib, Tem; Research & Development; Inspection & Measurement Products; Nanotechnology Equipment & Tools; PV Services; Microscopes; Optical Microscopes; Education, Training; Equipment, Nanotechnology Tools; Products; Surface Analysis Systems; Microscopes & Scanning Electron, Acoustic, Confocal, Upright, Inverted & Stereo; Quality & Compliance; Inspection; Product Design & Development; Test ...

Inspection & Measurement Products; Equipment, Nanotechnology Tools; Test Services or Consulting; Microscopes; Sem, Focused Ion Beam & Fib, Tem; Educational, Research Institutions; PV Equipment; Inspection & Metrology; Esca, Ultrasonic, Acoustical Microscopes; Spectrometers, Ftir, Atr Ftir, Auger Electron & Aes, Sims; Edu. Research Inst. & Non Profit, Academia, Schools, Printed Boards ...

Testing Labs; Products; Microanalysis & Digital Imaging Systems for Materials Analysis; Failure Analysis Test Sockets; Surface Analysis Systems; Microscopes & Scanning Electron, Acoustic, Confocal, Upright, Inverted & Stereo; Specialized Objectives; Failure Analysis Laser Cutter; Micro Electronics Laser; Ftir Equipment, Electronic Plugs ...

Products; Microscopes & Scanning Electron, Acoustic, Confocal, Upright, Inverted & Stereo; Microanalysis & Digital Imaging Systems for Materials Analysis; Testing Labs ...

Products; Microscopes & Scanning Electron, Acoustic, Confocal, Upright, Inverted & Stereo; Microanalysis & Digital Imaging Systems for Materials Analysis; Surface Analysis Systems & Services ...

Analysis; Services Contract RD Services; Services Contract RD; Equipment; Failure; Microscopes; Optical & & or Electron Microscopy & Sem; Materials Consulting; Materials Testing & Characterization; Tem Particle Size; Services Services; Analysis, Eyewear Accessories ...

Optics, Lens Products, Auto Focus Systems; Vision, Id, Bar Code Systems; Instruments, Bench Top Test; Computer, Control, Comms. Data Acquisition Systems; Defect, Particle, Contam. Detection & Review & Inspect; Exposure, Illumination Sources Laser, Lamp, xray & Handling, Transfer, Loading Systems, Lifting Devices; Microscopes; Atomic Force Microscopes & Afm; Testing Labs; Products; Microscopes & Scanning Electron ...

202 Equipment, General Use; Microscopes; Optical Microscopes; Components, Parts; Equipment, Inspection & Measurement; Heating Elements, Coils, Insulation, Vestibule Blocks, Furnace Components; Microscopes; Scanning Electron Microscope & Sem, Focused Ion Beam & Fib, Transmission Electron Micr; XRay, Xrf, 3D XRay, Lexes Systems; Vibration Isolation Systems; Film Thickness, Thickness, Uniformity Measurement, Semiconductor Industry, Heating Components, Heating Elements ...