E+H Metrology Offers a Complete Line of Wafer Geometry, Resistivity and Stress Measurement Systems. Wafers Up to 450Mm can be Measured on Manual Gauges or Fully-Automated Robotic or Belt Sorters Using Advanced Software. Thickness, Flatness, Bow, Warp, Stress and Wafer Resistivity can all be Measured in a Single High-Throughput Wafer Sorter Using the Advanced E+H Mx-Nt Operating Software. E+H's Proprietary Waferstudio Offers Unique 3D Visualization and Analysis. the E+H Manual Gauges and Automated ...

Industrial, Laboratory Equipment, Measuring Equipment, Test Instruments, We offer holiday detector, paint thickness gauge, testex tape, pinhole testers, digital surface profile gage, corrosion pit gauge, WFT gauges, conductivity meter, paint inspection kit, cross hatch cutter, pencil hardness tester, ISO comparator, dewpoint/ humidity meter, paint inspection manuals, coating defect manual, cathodic protection reference portable cells, pipeline, Hardness Tester ...