Application Specific Image Processing System Solutions for Non Contact Measurement and Quality Assurance, Image Processing Systems for Optical 3D Measurement, Image Processing Systems for Quality Assurance, Image Processing Systems for Surface Inspection, Infra Red Cameras ...

Viewing Angle Analyzer Ezcontrast, Optical Instruments, Spectrometer, Optical Measurement System, Luminance Meter ...

Measure Thin Films Fast with Artie, the Simplest Spectral Reflectance System Available. Measure Thin Films from 1Nm to 13Mm with Filmetrics Spectral Reflectance Based Systems. Filmetrics Features a Complete Line of Affordable UV to Nir Spectrometer Systems for Measuring Thickness, Optical Constants, and Deposition Rates of Thin Films. Our Thin Film Measurement Systems are Used in a Wide Range of Applications Including Optical Coatings, Glass & Plastic Thickness, Photovoltaics, Oleds, Medical Devices ...

Mse, Laser Distance, Laser Distance Meter, Laser Distance Sensor, Laser Distance Measuring, Laser, Laser Speed, Non Contact, Measurement, Sensor, Sensors, Measure, Length, Speed, Velocity, Distance, Width, Position, Thickness, Optical Sensors, Level, Distance, Non Contact & Optical Sensors and Measuring Systems for Velocity, Length, Distance, Width, Thickness, Level and Position of Cold as Well as Hot Material, Measurement Instruments, Distance Meter, Sensor and Transducer ...

Hirox USA is a pioneer of the 3 D digital microscope. Its digital microscope system is a versatile tool for measurement, recording, and seeing things as they truly are. Hirox’s high quality optical and lighting designs provide magnification range of 0x–10,000x, live focus, and real time 2 D & 3 D tiling with an automated XY stage ...

Angstrom Sun Tech's booth @ 2229; Angstrom Sun Technologies provides advanced but affordable TFProbe series optical instruments for thin film applications: 1 Desktop Film Thickness Mapping system with capability to handle 300mm wafer, 2 Microspectrophotometer and film thickness measurement system for MEMS and patterned wafer with a sampling region as small as 1 um, 3 Simple and easy to use thin film thickness ...

Profile Projector, Video Measuring System, Non Contact Measurement System, Illuminated Magnifiers, Co-Ordinate Measuring Machines, Tool Maker Microscope, Video Measuring Machines, Lm Guides, Rotary Encoders, Flexible Arm Illuminated Magnifiers, Horizontal Optical Measuring Machine, Projectors ...